Nikon Metrology Announces New Metrology CT System
Posted: 2012-5-9
Nikon Metrology combines 50 years’ experience of Coordinate Measuring
Machine (CMM) metrology with 25 years’ experience of X-ray Computed
Tomography (CT) to develop a new "absolute accuracy" Metrology CT system.
MCT225 provides Metrology CT for a wide range of sample sizes and material
densities with 9+ L/50 µm accuracy in accordance with the VDI/VDE 2630
guideline. All internal and external geometry is measured efficiently in a single
non-destructive process. A full 3D visualization of the sample volume
additionally provides valuable insights into part deformations and internal
structural integrity.
Metrology CT, the future of dimensional inspection
Metrology CT is the fusion of metrology and X-ray Computed Tomography (CT).
X-ray has long been used for industrial applications. With X-ray CT a number of
2D X-ray images are taken at different angles around the sample. All of the
external and internal geometry is captured as the X-rays pass through the
sample. CT software constructs a 3D model of the sample using these 2D
images. Dimensional characteristics such as size, position and form can be
measured directly using the model as well as full part-to-CAD comparison,
section reporting and GD&T analysis.
Absolute accuracy for internal geometry
MCT225 is pre-calibrated using accuracy standards traceable to the UK's
national measurement institute (NPL) and verified using VDI/VDE 2630
guidelines for Computed Tomography in Dimensional Measurement. "Absolute
accuracy" guarantees measurement accuracy without time consuming
comparative scans or reference measurements; samples are simply placed on a
rotary table inside the enclosure and measured.
A key component of the MCT225 system is the in-house developed Nikon
Metrology 225 kV micro-focus X-ray source. It produces incredibly sharp
images with low noise levels, enabling magnification levels up to 150x with
2µm feature detection.
High-precision linear guideways equipped with high-resolution optical
encoders are error corrected using the laser interferometer mapping techniques
employed for CMMs. For optimal accuracy and long term stability, Finite
Element Analysis (FEA) was used during the design phase to optimize the
stiffness of the manipulator.
To minimize thermal effects the interior of the MCT225 enclosure is
temperature controlled, effectively creating a conditioned measurement room
stable to 20°C ± 1°C.
Flexible efficiency
MCT255 is an invaluable asset for manufacturers seeking to benefit from
reduced leads times and inspection cycles. The powerful X-ray source and large
capacity manipulator combine with high magnification and detailed feature
detection to create a solution suited to a wide variety of applications.
Plastic injection-mold and metal die-cast manufacturers can significantly
reduce correction cycles during tool development and production start-up,
accelerating time to market for new products. All shrinkage, deformation and
dimensional errors are clearly identified in easy to understand inspection
reports making it easier to define corrective actions.
Emerging production techniques like additive manufacturing now make it
possible to produce small and highly complex components that can’t be
inspected using touch probes or optical sensors. Here too MCT225 makes it
possible to measure and analyze these components in a single non-destructive
operation.
ABOUT NIKON METROLOGY
Nikon Metrology offers the broadest range of metrology solutions for
applications ranging from miniature electronics to the largest aircrafts. Nikon
Metrology’s innovative measuring and precision instruments contribute to a
high performance design-through-manufacturing process that allows
manufacturers to deliver premium quality products in a shorter time. Further
information is available on www.nikonmetrology.com