CIVA ATHENA 2D FEM Module Available with CIVA UT (Video)

http://www.exte.../civa-athena-2d

CIVA ATHENA 2D is a new "add-on" module available with CIVA UT. This new tool consists in a hybrid module, using both conventional semi-analytical methods of CIVA and the FEM code ATHENA. The connection with Finite Elements allows taking into account more complex phenomena that can occur in a UT inspection.

In CIVA ATHENA 2D, a Finite Element rectangular box is defined. Out of this box, the beam propagation is modeled with the fast semi-analytical method of CIVA UT. In the FE box, the calculations are made by FEM (using the incident beam previously calculated on the box boundaries as an input). Typically, FEM will be used to simulate beam/defect interactions (and beam/geometry interactions), whereas the fast semi-analytic model will be used to simulate the round trip propagation of ultrasounds from and towards the transducer.

The main interest of CIVA ATHENA 2D is to take into account all physical phenomena that can take place in the beam/defect interaction (i.e. in the FE box): creeping waves generated by nearby critical incidence, multiple diffusion between flaws located in the same area, secondary diffraction echoes due to Rayleigh waves, computes interface echo, accounts for other phenomena that may be neglected or approximated with the semi-analytical approach.

In addition to its advanced capabilities, the coupling between CIVA & ATHENA has other advantages: the computation is faster than a complete Finite Element computation, while all phenomena are accounted for regarding the beam/defect interactions. The configuration is defined in the user-friendly CIVA interface, with very few specific parameters for the FEM calculation. Therefore, CIVA ATHENA 2D is easy to use.

CIVA ATHENA 2D uses a 2D beam computation and a 2D FEM calculation from ATHENA. Therefore, 3D effects are intrinsically ignored, while it gives very precise results as soon as the 2D hypothesis can be credited, which mainly means:

Considering only flaws that can be defined by their 2D cross-section: planar notches, multifaceted or branched flaws and Side Drilled Holes Comparing flaws response independently from their extension in the orthogonal plane: same extension and at the same depth, or extension larger than the beam width