Xradia Announces VersaXRM-410 Introduces Revolutionary X-ray Microscope
Posted: 2013-4-4
Xradia, Inc. is announcing the expansion of its lab-based VersaXRM family to
bridge the gap between high-performing 3D X-ray microscopy (XRM) solutions
and traditionally lower-cost, less capable projection-based computed
tomography (CT) systems. The VersaXRM-410 delivers the advantages of the
VersaXRM family including highest resolution and contrast and in situ
capabilities that enable ground-breaking research for the widest range of sample
sizes.
The University of California, Irvine, is using the VersaXRM-410 to
nondestructively characterize the microstructure and mechanics of composite
materials with applications in civil, mechanical, aerospace and biomedical
engineering. Professor Lizhi Sun says, "The newly installed VersaXRM-410 lets us
characterize the behavior and local deformation of materials in 3D in their native
environments (in situ) while uniquely maintaining sub-micron resolution across
an array of sample dimensions and environments. What's even more powerful is
that we can extend the understanding of a material's microstructure to the 4th
dimension (3D + time) by studying how a microstructure evolves over time, and
quantify that change. Only non-destructive X-ray tomography lets us achieve
that goal."
Dr. Kevin Fahey, Chief Materials Scientist and VP of Marketing at Xradia, says the
VersaXRM family was architected to make advanced imaging capabilities
available to more researchers worldwide. "Research facilities face economic
constraints, but at the same time, studies increasingly demand the non-
destructive, high-resolution, high-contrast 3D imaging enabled by XRM," Fahey
says. "VersaXRM brings synchrotron-like capabilities to the lab, overcoming the
resolution and contrast limitations of traditional micro-computed tomography
approaches to advance studies being conducted today and into the future."
VersaXRM: Extending the Boundaries of Science
The VersaXRM family with its unique architecture offers the only imaging
solution that combines:
Non-destructive 3D X-ray imaging, preserving and extending the use of valuable
samples
High resolution: 0.9 µm true spatial resolution on the VersaXRM-410 with
minimum achievable voxel size of 100 nm*
Advanced contrast: absorption contrast and unique phase contrast enable
unparalleled imaging quality for soft materials such as unstained tissue or low-Z
materials like carbon fibers and polymers, with the ability to differentiate
between phases of similar density
Industry-leading 4D and in situ capabilities including for flexible sample sizes
and types, enabled by the VersaXRM's Resolution at a Distance (RaaD™)
Leveraging Xradia's pre-eminent position as a provider of X-ray microscopes to
the synchrotron community, the introduction of the award-winning VersaXRM-
500 in 2011 extended the boundaries of lab-based imaging. Since then,
VersaXRM family instruments have advanced groundbreaking research in
numerous fields such as in materials science, life sciences, oil and gas
exploration, mineralogy, and the electronics industry.
The VersaXRM-410: Bridging the Cost-Resolution Gap
The VersaXRM-410 microscope represents a powerful "workhorse" solution that
is ideally suited to diverse lab environments. The instrument delivers the high
resolution associated with VersaXRM at costs more typical of lower resolution
micro- or nano-CT solutions.
Standard on the VersaXRM-410 is Xradia's Scout-and-Scan™ Control System,
providing easy set-up and control of experiments for a wide range of users with
varying skillsets typical of a busy scientific imaging lab. The system also features
Wide Field Mode (WFM) offering up to a 90 mm 3D field of view, double the
capability of older systems. A new enhanced workstation provides higher
performance while keeping the system in cost/performance ranges accessible to
a large spectrum of users and research institutions. Additionally, a new optional
150kV 30W high power source enables up to 3X faster imaging for the largest
fields of view.
*About Resolution
Voxel (sometimes referred to as "nominal resolution" or "detail detectability") is a
geometric term that contributes to but does not equal resolution. Xradia
specifies on spatial resolution, the most meaningful measurement of an
instrument's performance.
About Xradia
Xradia designs and manufactures microscopes for industrial and academic
research applications. Xradia's solutions offer unparalleled high contrast and
high resolution imaging capabilities for a large range of sample sizes and
shapes. The company's heritage began in the synchrotron and extends to the
laboratory. Xradia's laboratory product families, the UltraXRM-L and VersaXRM™,
together offer a multi-length scale solution delivering full volume 3D imaging
with resolution down to 50 nm. Additional information can be found at
www.xradia.com.
bridge the gap between high-performing 3D X-ray microscopy (XRM) solutions
and traditionally lower-cost, less capable projection-based computed
tomography (CT) systems. The VersaXRM-410 delivers the advantages of the
VersaXRM family including highest resolution and contrast and in situ
capabilities that enable ground-breaking research for the widest range of sample
sizes.
The University of California, Irvine, is using the VersaXRM-410 to
nondestructively characterize the microstructure and mechanics of composite
materials with applications in civil, mechanical, aerospace and biomedical
engineering. Professor Lizhi Sun says, "The newly installed VersaXRM-410 lets us
characterize the behavior and local deformation of materials in 3D in their native
environments (in situ) while uniquely maintaining sub-micron resolution across
an array of sample dimensions and environments. What's even more powerful is
that we can extend the understanding of a material's microstructure to the 4th
dimension (3D + time) by studying how a microstructure evolves over time, and
quantify that change. Only non-destructive X-ray tomography lets us achieve
that goal."
Dr. Kevin Fahey, Chief Materials Scientist and VP of Marketing at Xradia, says the
VersaXRM family was architected to make advanced imaging capabilities
available to more researchers worldwide. "Research facilities face economic
constraints, but at the same time, studies increasingly demand the non-
destructive, high-resolution, high-contrast 3D imaging enabled by XRM," Fahey
says. "VersaXRM brings synchrotron-like capabilities to the lab, overcoming the
resolution and contrast limitations of traditional micro-computed tomography
approaches to advance studies being conducted today and into the future."
VersaXRM: Extending the Boundaries of Science
The VersaXRM family with its unique architecture offers the only imaging
solution that combines:
Non-destructive 3D X-ray imaging, preserving and extending the use of valuable
samples
High resolution: 0.9 µm true spatial resolution on the VersaXRM-410 with
minimum achievable voxel size of 100 nm*
Advanced contrast: absorption contrast and unique phase contrast enable
unparalleled imaging quality for soft materials such as unstained tissue or low-Z
materials like carbon fibers and polymers, with the ability to differentiate
between phases of similar density
Industry-leading 4D and in situ capabilities including for flexible sample sizes
and types, enabled by the VersaXRM's Resolution at a Distance (RaaD™)
Leveraging Xradia's pre-eminent position as a provider of X-ray microscopes to
the synchrotron community, the introduction of the award-winning VersaXRM-
500 in 2011 extended the boundaries of lab-based imaging. Since then,
VersaXRM family instruments have advanced groundbreaking research in
numerous fields such as in materials science, life sciences, oil and gas
exploration, mineralogy, and the electronics industry.
The VersaXRM-410: Bridging the Cost-Resolution Gap
The VersaXRM-410 microscope represents a powerful "workhorse" solution that
is ideally suited to diverse lab environments. The instrument delivers the high
resolution associated with VersaXRM at costs more typical of lower resolution
micro- or nano-CT solutions.
Standard on the VersaXRM-410 is Xradia's Scout-and-Scan™ Control System,
providing easy set-up and control of experiments for a wide range of users with
varying skillsets typical of a busy scientific imaging lab. The system also features
Wide Field Mode (WFM) offering up to a 90 mm 3D field of view, double the
capability of older systems. A new enhanced workstation provides higher
performance while keeping the system in cost/performance ranges accessible to
a large spectrum of users and research institutions. Additionally, a new optional
150kV 30W high power source enables up to 3X faster imaging for the largest
fields of view.
*About Resolution
Voxel (sometimes referred to as "nominal resolution" or "detail detectability") is a
geometric term that contributes to but does not equal resolution. Xradia
specifies on spatial resolution, the most meaningful measurement of an
instrument's performance.
About Xradia
Xradia designs and manufactures microscopes for industrial and academic
research applications. Xradia's solutions offer unparalleled high contrast and
high resolution imaging capabilities for a large range of sample sizes and
shapes. The company's heritage began in the synchrotron and extends to the
laboratory. Xradia's laboratory product families, the UltraXRM-L and VersaXRM™,
together offer a multi-length scale solution delivering full volume 3D imaging
with resolution down to 50 nm. Additional information can be found at
www.xradia.com.
