Xradia Extends X-ray Microscopy to Advance Pursuit of Discovery
Posted: 2013-6-4
Xradia is announcing a new X-ray microscope that gives scientists
unprecedented flexibility for studying hard-to-image materials and their
microstructures within industrial and scientific laboratory environments. The new
VersaXRM-520 extends the boundaries of non-destructive 3D imaging with
advanced contrast tuning capabilities, extensive filtering options, and
enhancements delivering greater accuracy and workflow efficiency.
"Our philosophy in continuing to extend the capabilities of the VersaXRM family
is to free scientists to keep pushing the limits of lab-based 3D X-ray imaging,"
says Dr. Kevin P. Fahey, Chief Materials Scientist and Vice President of Marketing
at Xradia, Inc. "We started with high resolution at flexible working distances,
excellent contrast capabilities, and a powerful in situ solution. Now with the
VersaXRM-520 we're delivering even better ways to explore contrast mechanisms
for challenging samples, and expanding in situ capabilities to become the
industry's leading solution for studying samples at high resolution in a variety of
environments. We continue to innovate and bring flexibility to the lab to free
VersaXRM users to break through traditional barriers to discovery in 3D."
Leveraging Xradia's synchrotron-caliber optics and industry-best resolution and
contrast capabilities, the VersaXRM-520 introduces:
Dual-Scan Contrast Visualizer (DSCoVer) for Compositional Contrast: flexible
side-by-side tuning of two distinct tomographies enables compositional probing
for features often indistinguishable in a single scan. DSCoVer enables
researchers to seamlessly and easily collect the data required for dual energy
analysis. By enabling the efficient alignment of two datasets at different incident
X-ray energies, the user is able to decouple some contrast mechanisms and
freely explore contrast for features of interest within a sample.
Automated Filter Changer: enabling select or application-specific filters to be
changed within recipes without manual intervention for greater ease of use and
workflow efficiencies. The AFC houses source filters used to tune the X-ray
energy spectrum, with selection easily programmed and recorded for future use.
The AFC ships with a standard set of twelve filters and features twelve additional
slots to accommodate custom source filters such as those composed of different
materials and thicknesses.
High-Aspect Ratio Tomography (HART): a higher-throughput imaging mode
delivering tomography acquisition up to 50% faster for flat sample geometries.
HART leverages Xradia's "resolution at a distance" (RaaD) leadership to overcome
traditional inefficiencies inherent in imaging high aspect ratio samples where one
dimension is much greater than another. Variable projection spacing allows
tomographies to be completed faster with the same or better quality than
traditional even-spacing mode.
For example, HART dramatically speeds throughput in analyzing semiconductor
failures where flat chip designs must be viewed through the long dimension to
fully explore where and how defects occur and propagate. These resulting high
resolution virtual cross sections offer an attractive alternative to destructive
physical cross-sectioning.
In situ Interface Kit: enabling the highest-performance in situ 3D XRM
characterization. Continuing to push the limits for scientific advancement, the
rock-solid VersaXRM platform has emerged as the industry's premier solution
enabling the use of the widest variety of in situ rigs, from high pressure flow
cells to tension, compression and thermal stages. Leveraging RaaD, in situ
experiments can be accomplished while maintaining high resolution, despite
being enclosed in specialized sample environments. The optional In Situ
Interface Kit is available on all VersaXRM instruments. Contents include a
mechanical integration kit, a robust cabling guide and feed-throughs, as well a
recipe-based software capability that simplifies operation from within the
VersaXRM user interface.
All of the new features introduced by the VersaXRM-520 are seamlessly
integrated in the recently announced Scout-and-Scan control system software,
an efficient workflow environment allowing users to easily scout a region of
interest and specify scanning parameters. Taken in total, the new flexibility
features extend the researcher's degrees of freedom and deliver on Xradia's
commitment to increasing the versatility, viability, and overall value of lab-based
imaging.
unprecedented flexibility for studying hard-to-image materials and their
microstructures within industrial and scientific laboratory environments. The new
VersaXRM-520 extends the boundaries of non-destructive 3D imaging with
advanced contrast tuning capabilities, extensive filtering options, and
enhancements delivering greater accuracy and workflow efficiency.
"Our philosophy in continuing to extend the capabilities of the VersaXRM family
is to free scientists to keep pushing the limits of lab-based 3D X-ray imaging,"
says Dr. Kevin P. Fahey, Chief Materials Scientist and Vice President of Marketing
at Xradia, Inc. "We started with high resolution at flexible working distances,
excellent contrast capabilities, and a powerful in situ solution. Now with the
VersaXRM-520 we're delivering even better ways to explore contrast mechanisms
for challenging samples, and expanding in situ capabilities to become the
industry's leading solution for studying samples at high resolution in a variety of
environments. We continue to innovate and bring flexibility to the lab to free
VersaXRM users to break through traditional barriers to discovery in 3D."
Leveraging Xradia's synchrotron-caliber optics and industry-best resolution and
contrast capabilities, the VersaXRM-520 introduces:
Dual-Scan Contrast Visualizer (DSCoVer) for Compositional Contrast: flexible
side-by-side tuning of two distinct tomographies enables compositional probing
for features often indistinguishable in a single scan. DSCoVer enables
researchers to seamlessly and easily collect the data required for dual energy
analysis. By enabling the efficient alignment of two datasets at different incident
X-ray energies, the user is able to decouple some contrast mechanisms and
freely explore contrast for features of interest within a sample.
Automated Filter Changer: enabling select or application-specific filters to be
changed within recipes without manual intervention for greater ease of use and
workflow efficiencies. The AFC houses source filters used to tune the X-ray
energy spectrum, with selection easily programmed and recorded for future use.
The AFC ships with a standard set of twelve filters and features twelve additional
slots to accommodate custom source filters such as those composed of different
materials and thicknesses.
High-Aspect Ratio Tomography (HART): a higher-throughput imaging mode
delivering tomography acquisition up to 50% faster for flat sample geometries.
HART leverages Xradia's "resolution at a distance" (RaaD) leadership to overcome
traditional inefficiencies inherent in imaging high aspect ratio samples where one
dimension is much greater than another. Variable projection spacing allows
tomographies to be completed faster with the same or better quality than
traditional even-spacing mode.
For example, HART dramatically speeds throughput in analyzing semiconductor
failures where flat chip designs must be viewed through the long dimension to
fully explore where and how defects occur and propagate. These resulting high
resolution virtual cross sections offer an attractive alternative to destructive
physical cross-sectioning.
In situ Interface Kit: enabling the highest-performance in situ 3D XRM
characterization. Continuing to push the limits for scientific advancement, the
rock-solid VersaXRM platform has emerged as the industry's premier solution
enabling the use of the widest variety of in situ rigs, from high pressure flow
cells to tension, compression and thermal stages. Leveraging RaaD, in situ
experiments can be accomplished while maintaining high resolution, despite
being enclosed in specialized sample environments. The optional In Situ
Interface Kit is available on all VersaXRM instruments. Contents include a
mechanical integration kit, a robust cabling guide and feed-throughs, as well a
recipe-based software capability that simplifies operation from within the
VersaXRM user interface.
All of the new features introduced by the VersaXRM-520 are seamlessly
integrated in the recently announced Scout-and-Scan control system software,
an efficient workflow environment allowing users to easily scout a region of
interest and specify scanning parameters. Taken in total, the new flexibility
features extend the researcher's degrees of freedom and deliver on Xradia's
commitment to increasing the versatility, viability, and overall value of lab-based
imaging.
