The gradient of a deformation field is measured directly in digital shearography, and near-surface defects are found by recognizing specific ‘butterfly’ patterns on the phase map created by phase-shift digital shearography. However, the low acquisition rate of traditional temporal phase-shift-based digital shearography (usually 1–2Hz due to multiple phase-shift steps in the temporal domain) has limited its application to static or quasi-static loading situations.1,2 We developed a novel spatial phase-shift digital shearography system, using the spatial frequency carrier method and a simple Michelson interferometer setup for dynamic loading.
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