Mistras Group
Renishaw Raman System Used with SEM to Study Fibers at UCLA
Posted:
The University of California, Los Angeles (UCLA), USA, combines Raman
microscopy with scanning electron microscopy (SEM) to study
archaeological textiles and fibres.

UCLA use a Renishaw SEM-SCA system to study textiles and fibres, non-
destructively. The full paper describing the work has been published by the
Journal of Raman Spectroscopy (John Wiley & Sons, Ltd.).

The Department of Materials Science and Engineering at UCLA delivers
novel and highly innovative research that advances basic and applied
knowledge in materials. This is achieved through interactions with the
external community, and educational outreach and industrial collaborations.
This is illustrated by a paper joint-authored by scientists from UCLA, the Los
Angeles County Museum of Art, the Cotsen Institute of Archaeology and
instrumentation manufacturer, Renishaw1. The paper "New Advancements in
SERS Dye Detection Using Interfaced SEM and Raman Spectromicroscopy
(µRS)" is published in the Journal of Raman Spectroscopy. It describes how
a SEM may be interfaced with µRS to provide a means of non-destructively
identifying organic compounds in complex samples, such as single fibres, by
extractionless analysis. This enables the characterisation of dyes from
reference collections and archaeological textiles.

The lead author of the work is UCLA scientist, Dr Sergey V Prikhodko. He
describes why Raman Spectromicroscopy has become a powerful analytical
technique for the study of artistic, historical and archaeological materials:
"As a non-destructive method that may also be interfaced with other
techniques, it makes the sample reusable for subsequent analyses after
performing µRS. In situ morphological characterization, elemental
identification and structural analysis integrates µRS with SEM and energy
dispersive X-ray spectroscopy (EDS) in the ‘hyphenated' SEM-EDS-µRS
system, at UCLA. This vital capability was brought together with the
Renishaw SEM-SCA interface, where a Nova 230 SEM (FEI) is coupled to the
Renishaw inVia confocal Raman microscope to provide structural and
chemical analysis in situ."

Image:
Dr Sergey V Prikhodko from UCLA with his SEM-SCA

Dr Prikhodko's results on samples of various fibres clearly illustrate the
potential of this non-destructive method. Interfacing SEM with µRS provides
a very powerful tool to analyse unique and irreplaceable samples and
artefacts quickly and in a cost-effective manner.

Please visit http://www.renishaw.com/SEMRaman for further details of
Renishaw's inVia confocal Raman microscope and the SEM-SCA interface.
Evident Ultrasonic Inspection Equipment