Sonatest will be Exhibiting at the 15th APCNDT Conference in Singapore, November 13th-17th
Start Date:
1/1/1900 1:11:17 PM
End Date:
1/1/1900 5:11:17 PM
On show will be a wide range of Sonatest products including D70 and 700M Series of UT Flaw Detectors and a live demonstration of Xpair, our new PC-based software application solution designed to manage data transfer and remote control of instruments in the field wherever a network connection is available.
In addition Dominic Giguere from Sonatest Quebec will be presenting papers on the Pros and Cons of PA techniques in the inspection of stainless steel components and Advanced Imaging Techniques for linear scanning defects characterisation.
Come and meet the team at stand B13
In addition Dominic Giguere from Sonatest Quebec will be presenting papers on the Pros and Cons of PA techniques in the inspection of stainless steel components and Advanced Imaging Techniques for linear scanning defects characterisation.
Come and meet the team at stand B13
