SIUI attended the 20th China International Exhibition on Quality Control & Testing Equipment
Posted: 2015-7-2
Source:
http://www.siui.com/ndt
In June 16-18, SIUI attended the 20th China International
Exhibition on Quality Control & Testing Equipment in Shanghai
and released the latest Phased Array bracelet crawler LPS-
01/LPS-02.
Most of customers were very impressed by SIUI product range,
like upgradeable Ultrasonic PA & TOFD flaw detector SyncScan,
high-end Ultrasonic PA & TOFD flaw detector SUPOR and new set
of NDT solution.
And the CTS-900X series flaw detectors specified by the
National NDT Skill Competition especially impressed all
professional attendees by their high performance and superior
quality.
Exhibition on Quality Control & Testing Equipment in Shanghai
and released the latest Phased Array bracelet crawler LPS-
01/LPS-02.
Most of customers were very impressed by SIUI product range,
like upgradeable Ultrasonic PA & TOFD flaw detector SyncScan,
high-end Ultrasonic PA & TOFD flaw detector SUPOR and new set
of NDT solution.
And the CTS-900X series flaw detectors specified by the
National NDT Skill Competition especially impressed all
professional attendees by their high performance and superior
quality.
