October 16, 2018 at 10:00 AM EDT (4:00 PM CEST)
General introduction to nondestructive XRF material inspection
What's possible with XRF technology and what’s not
Examples of thickness analyses on different materials
Presenter: Thomas Sauer
Thomas Sauer is a senior application and product specialist for X-ray fluorescence (XRF) at Olympus Europa. He has a degree in electrical engineering with a focus on laser applications and materials science. He has been working on XRF for material analysis since 1999 and contributed to the development of an in-line XRF coal analyzer. He joined Olympus in 2010, where he helps develop new applications and calibrations and provides user support and training.