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        	         Portable Phased Array System CTS-602  
        		
        	        
        	            Company:
        	            SIUI
        	         
        		
        	        
        	            Contact:
        	            Rebecca
        	         
        		
        	        
        	            Address1:
        	            #77 Jinsha Road
        	         
        		
        	        
        	            City:
        	            Shantou
        	         
        		
        	        
        	            State:
        	            Guangdong
        	         
        		
        	        
        	            Country:
        	            China
        	         
        		
        	        
        	            Phone:
        	            86-754-88250150
        	         
        		
        	        
        	            Fax:
        	            86-754-882501499
        	         
        		
        	        
        		
        	        
        	            Email:
        	            business@siui.com
        	         
        		
				
				
    
                
                
        	        
    	                The CTS-602 is a multi-channel flaw detector using phased array imaging 
 
                
            
                
        		
        		    technology with compact size and outstanding performance. Perfect combination of sector and linear scan is designed to meet the demanding NDT inspection. It can be widely used in various industries, such as aerospace, power generation, oil & gas and transportation. SIUI is the first China manufacturer releasing the portable phased array ultrasonic flaw detector with full intellectual property right. All the hardware circuit, operation software, housing and probes are designed by SIUI. 
        				Up to 32 T/R channels, compatible with 16/32/64/128-element probes.
Transmit single focusing and receive dynamic focusing.
2 modes (conventional UT and Phased Array) in 1 system for easy testing and 
evaluation. 
A/B/C/D and sector scan functions are available.
Automatic probe identification function.
Up to 8KHz repeat frequency for high speed scanning.
        	         
        	       
                
        		
        		    
        				The use of phased array technology makes scanning faster and easier. Real-
time color image including A/B/C/D and sector scanning can see defects in 
different views and make defects visible. Linear & sector scan, and dynamic 
depth focusing is available, as well as wide beam and multi-focus points to 
improve inspection efficiency. 
        	         
        	    
    
    
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