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Veo
Company: Sonatest
The Veo Phased Array ultrasonic flaw detector reinforces Sonatest's reputation
for innovative technician focused product development. The veo's simple
controls, superior performance, advanced features and rugged enclosure deliver
simplicity, capability and reliability to the technician's finger tips.
PHASED ARRAY Configuration 16:64 (16 pulser/receivers; driving up to 64 elements) Transducer Socket I-PEX Pulse Voltage -50 V to 100 V (in steps of 10 V) Data Acquisition Architecture Full digital delay and sum architecture Digitizing Frequency 50/100 MHz Digitizer Resolution 12 bits Data Processing 16 bits samples Data recording Full raw data recorded Max A-Scan Length 8192 samples (32 metres in steel LW, 50MHz, 1:128) Scan & Views Supported Scans S-Scan & L-Scan Real Time Views S, L, B, C-Scan, Top and End view Colour Maps 8 Standards (Rainbow, Grayscale, Spectrum, Aeronautic or custom) Multi Group Multiple Sector scans and TFOD CONVENTIONAL UT/TOFD (MONO ELEMENT CHANNELS) No. of Channels 2 TX/RX (2 multiplexed channels) Test Mode Pulse-Echo, transmit/receive, TOFD Receivers Gain Range 102dB (-30dB to 72dB) Filter Bands Narrow bands centred at 0.5 MHz, 1 MHz, 2.25 MHz 5 MHz, 10 MHz and 15 MHz; Broadband at 1 MHz to 18 MHz (-6dB) CONVENTIONAL AND PHASED ARRAY DAC DAC Quantity 1 with 3 sub-DAC (per focal law in PA) Time Corrected Gain (TCG) Gates A-Scan Gates 4 gates per A-scan (3 extracted A-scans per S/L-scan) Gate Trigger Flank/Peak S/L-Scan 2 “2D gates” per S/L-scan Alarm LED 1 (sync on all gates & DACs) Measurements Available in A-Scan view 1D Peak (FSH, dB, D, BPL, SD) 1D Flank (FSH, dB, D, BPL, SD) Echo to Echo
Curtiss Wright Nuclear